Phenotypic and genotypic characterization of electron beam treated inter-specific ( <i>Triticum dicoccum</i> Schrank X <i>Triticum carthlicum</i> Nevski) lines of emmer wheat for leaf rust and stem rust resistance
The resistance present in the parent lines remained intact in the selected mutant lines even after exposure to electron beam. Mutants thus obtained could be released as cultivars or utilized as a potential source for high yielding, rust resistance for the improvement of emmer wheat. This is the first report of beneficial mutants in emmer wheat using electron beam.
Authors
- Abhijit Shaligram Shitre
- V. K. A. Gopu
- Vikas Venu Kumaran
- Pramod Prasad (ORCID: https://orcid.org/0000-0003-4091-1119)
- Suma S. Biradar (ORCID: https://orcid.org/0000-0001-5775-5306)
- Geetha Murugan
- Sudhir Navathe (ORCID: https://orcid.org/0000-0002-8040-5563)
- M. Sivasamy (ORCID: https://orcid.org/0000-0003-4413-7570)
- Bikram Das (ORCID: https://orcid.org/0000-0001-8919-7476)
- M. Kanchana (ORCID: https://orcid.org/0000-0001-7355-6825)
- C. Appunu
- John Victor Peter (ORCID: https://orcid.org/0000-0002-3423-1830)
- Gautam Vishwakarma
- Yashavathakumar Kakanur Jagadeesha
- Suganya Chinnaswamy
- Harish Chandar Subbiah Gounder Rajendran
- Lalitha Gundeappa
- Jayaprakash Paramasivan
Institutions
- Bhabha Atomic Research Centre (IN)
- Agharkar Research Institute (IN)
- Indian Institute of Wheat and Barley Research (IN)
- Sugarcane Breeding Institute (IN)
- Indian Agricultural Research Institute (IN)
Publication Details
- Journal
- International Journal of Radiation Biology
- Published
- 2025-05-05
- DOI
- https://doi.org/10.1080/09553002.2025.2494547
- Primary Topic
- Wheat and Barley Genetics and Pathology
- Type
- article
- Field-Weighted Citation Impact
- 0.00