Whole Metagenomic-Assembled Genome (MAG) Resource for <i>Xylella fastidiosa</i> subsp. <i>multiplex</i> GaT2 Causing Pecan Bacterial Leaf Scorch in Georgia, United States

Xylella fastidiosa ( Xf) is an endophytic bacterial pathogen that causes bacterial leaf scorch in pecan ( Carya illinoinensis). DNA was isolated from a symptomatic pecan tree (cultivar Byrd) in Albany, Georgia. High-throughput sequencing (Illumina PE150) was performed. Assembly was performed and referenced to available GenBank sequences with high read-mapping rates. The genome of strain Oak 35784 (ASM2145990v1, CP090511.1) had the highest percentage of mapped reads and was selected as the reference for a guided assembly. The final assembly of the GaT2 metagenomic-assembled genome (MAG) (ASM4286244v1, GCA_042862445.1) was 2,735,877 bp in 89 contigs, with an N50 of 848,678 bp, a GC content of 51.88%, a BUSCO score of 100% (domain bacteria_odb10) and 83.5% (lineage “Xanthomonadales”), and an average nucleotide identity of 99.33% to 11 Xf subsp. multiplex genome assemblies. The GaT2 genome sequence is the first for Xf from pecan and will be a valuable resource for future research. [Formula: see text] Copyright © 2025 The Author(s). This is an open access article distributed under the CC BY-NC-ND 4.0 International license .