Analysis and Validation of High-Accuracy Simple Monte Carlo Model for Photon Detection Probability in SPAD

Silicon-based single-photon avalanche diodes (SPADs) can realize extremely weak light detection, and are widely used in marine LiDAR, space exploration, fluorescence imaging and other fields. Accurately modeling the photon detection probability (PDP) of SPAD is crucial for promoting the performance of photoelectric sensors. In this paper, the SPADs are used to simulate the microscopic motion process of carriers based on the simple Monte Carlo (SMC) model, which in turn predicts the macroscopic electrical parameter PDP. Utilizing the SMC model, we designed and fabricated two types of SPAD devices with different avalanche junctions using the 0.18 μm Bipolar-CMOS-DMOS (BCD) process. The experimental test results closely match our predictions: for SPAD-A (N+/PW avalanche junction), the absolute average error for PDP is 1.48%, with the maximum error of 5.20%@360 nm. For SPAD-B (P+/NW avalanche junction), the absolute average error for PDP is 1.61%, with a maximum error of 5.10%@900 nm.

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Publication Details

Journal
IEEE Sensors Journal
Published
2025-05-05
DOI
https://doi.org/10.1109/jsen.2025.3564964
Citations
1
Primary Topic
Advanced Optical Sensing Technologies
Type
article
Field-Weighted Citation Impact
1.19

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article

Analysis and Validation of High-Accuracy Simple Monte Carlo Model for Photon Detection Probability in SPAD

Yuxuan Yang, Zixuan Wang, Jian Yang, Yang Wang et al.
1 citations
IEEE Sensors Journal
Advanced Optical Sensing Technologies
1.19
article

Analysis and Validation of High-Accuracy Simple Monte Carlo Model for Photon Detection Probability in SPAD

Yuxuan Yang, Zixuan Wang, Jian Yang, Yang Wang, Xiangliang Jin, Z.-H. Cao
article en
1 citations

Abstract

Silicon-based single-photon avalanche diodes (SPADs) can realize extremely weak light detection, and are widely used in marine LiDAR, space exploration, fluorescence imaging and other fields. Accurately modeling the photon detection probability (PDP) of SPAD is crucial for promoting the performance of photoelectric sensors. In this paper, the SPADs are used to simulate the microscopic motion process of carriers based on the simple Monte Carlo (SMC) model, which in turn predicts the macroscopic electrical parameter PDP. Utilizing the SMC model, we designed and fabricated two types of SPAD devices with different avalanche junctions using the 0.18 μm Bipolar-CMOS-DMOS (BCD) process. The experimental test results closely match our predictions: for SPAD-A (N+/PW avalanche junction), the absolute average error for PDP is 1.48%, with the maximum error of 5.20%@360 nm. For SPAD-B (P+/NW avalanche junction), the absolute average error for PDP is 1.61%, with a maximum error of 5.10%@900 nm.

IEEE Sensors JournalVol. 25(12)
Hunan Normal University (CN), Changsha Normal University (CN), Nanjing University of Posts and Telecommunications (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 22%
Advanced Optical Sensing Technologies
1.19
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Analysis and Validation of High-Accuracy Simple Monte Carlo Model for Photon Detection Probability in SPAD — Yuxuan Yang, Zixuan Wang, et al. · IEEE Sensors Journal (2025) | TGRS Research Map | TGRS