Constructing Controlled Random Tests with a Small Number of Test Patterns

The article considers the issues of testing computing systems and their components. A class of controlled probabilistic tests with a small number of tests patterns is identified and studied. A method for constructing controlled probabilistic tests with a given Hamming distance is presented, the basis of which is one-dimensional scaling of templates representing tests of small bit depth. It is proposed to use exhaustive and pseudo-exhaustive tests as templates for obtaining controlled probabilistic tests. The properties of the generated tests and approaches to their use as an alternative to probabilistic tests are studied. The efficiency of the method for constructing controlled probabilistic tests is experimentally analyzed and confirmed for the case of testing memory devices for the presence of complex code-sensitive faults.