Real‐Time Self‐Optimization of Quantum Dot Laser Emissions During Machine Learning‐Assisted Epitaxy
Traditional methods for optimizing light source emissions rely on a time-consuming trial-and-error approach. While in situ optimization of light source gain media emission during growth is ideal, it has yet to be realized. In this work, in situ reflection high-energy electron diffraction (RHEED) is integrated with machine learning (ML) to correlate the surface reconstruction with the photoluminescence (PL) of InAs/GaAs quantum dots (QDs), which serve as the active region of lasers. A lightweight ResNet-GLAM model is employed for the real-time processing of RHEED data as input, enabling effective identification of optical performance. This approach guides the dynamic optimization of growth parameters, allowing real-time feedback control to adjust the QDs emission for lasers. InAs QDs on GaAs substrates are successfully optimized, with a 3.2-fold increase in PL intensity and a reduction in full width at half maximum (FWHM) from 36.69 to 28.17 meV. Automated, in situ self-optimized lasers with 5-layer InAs QDs achieved electrically pumped continuous-wave operation at 1240 nm with a low threshold current of 150 A cm<sup>-</sup> <sup>2</sup> at room temperature, an excellent performance comparable to samples grown through traditional manual multi-parameter optimization methods. These results mark a significant step toward intelligent, low-cost, and reproductive light emitters production.
Authors
- Chao Shen (ORCID: https://orcid.org/0000-0002-3664-4874)
- Chi Xu (ORCID: https://orcid.org/0000-0002-3374-1580)
- Siming Chen (ORCID: https://orcid.org/0000-0002-4361-0664)
- Zhanguo Wang (ORCID: https://orcid.org/0000-0001-6395-2517)
- Tien Khee Ng (ORCID: https://orcid.org/0000-0002-1480-6975)
- Wenkang Zhan
- Chao Zhao (ORCID: https://orcid.org/0000-0002-9582-1068)
- Bo-Wei Xu (ORCID: https://orcid.org/0000-0003-2066-6902)
- Hui Cong (ORCID: https://orcid.org/0000-0003-4489-8353)
- Xue Chun-Lai
- Hongyue Hao
- Shujie Pan (ORCID: https://orcid.org/0009-0009-0983-622X)
- Ning Zhuo (ORCID: https://orcid.org/0000-0002-1489-7782)
- Kaiyao Xin (ORCID: https://orcid.org/0009-0001-9834-9619)
Institutions
- Chinese Academy of Sciences (CN)
- Institute of Semiconductors (CN)
- University of Chinese Academy of Sciences (CN)
- King Abdullah University of Science and Technology (SA)
Publication Details
- Journal
- Advanced Science
- Published
- 2025-05-02
- DOI
- https://doi.org/10.1002/advs.202503059
- Citations
- 5
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 3.65
Funders
- National Natural Science Foundation of China
- Natural Science Foundation of Beijing Municipality
- National Key Research and Development Program of China