Dynamic Current Sharing Issues with Paralleling SiC Power MOSFETs

This work comprehensively evaluates the key factors that impact the dynamic current sharing of paralleling silicon carbide (SiC) MOSFETs at the phase-leg circuit level. The power device matching is necessary and is well-known method to improve current balance. Stray inductance differences in the power loop, gate drive loop, and printed circuit board (PCB) layout are also well-known key factors. In addition to the above conventional sorting and passive matching methods, this paper proposes additional active matching approach by using the negative gate-off voltage, which can not only eliminate switching noise induced false turn on, but also help current sharing with gating signal delay matching similar to adjusting gate resistance. Impact of all key factors have been verified through experimental results.

Authors

Institutions

Publication Details

Published
2025-03-16
DOI
https://doi.org/10.1109/apec48143.2025.10977268
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Dynamic Current Sharing Issues with Paralleling SiC Power MOSFETs

Jih‐Sheng Lai, Ching-Yao Liu, Chen-Chan Lee
Silicon Carbide Semiconductor Technologies
article

Dynamic Current Sharing Issues with Paralleling SiC Power MOSFETs

Jih‐Sheng Lai, Ching-Yao Liu, Chen-Chan Lee
article en

Abstract

This work comprehensively evaluates the key factors that impact the dynamic current sharing of paralleling silicon carbide (SiC) MOSFETs at the phase-leg circuit level. The power device matching is necessary and is well-known method to improve current balance. Stray inductance differences in the power loop, gate drive loop, and printed circuit board (PCB) layout are also well-known key factors. In addition to the above conventional sorting and passive matching methods, this paper proposes additional active matching approach by using the negative gate-off voltage, which can not only eliminate switching noise induced false turn on, but also help current sharing with gating signal delay matching similar to adjusting gate resistance. Impact of all key factors have been verified through experimental results.

National Yang Ming Chiao Tung University (TW), National Taiwan University (TW), Virginia Tech (US)
Ministry of Education, National Science and Technology Council
Affordable and clean energy
Openalex Percentile: Top 93%
Silicon Carbide Semiconductor Technologies
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.