Mitigating Gate Voltage Oscillation in Parallel SiC Power Modules for xEV

Global vehicle electrification is accelerating to combat global warming. Recently, Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are increasingly used in electric vehicle inverters for their low power loss at fast switching speeds compared to conventional Silicon Insulated Gate Bipolar Transistors (IGBTs). Although SiC MOSFETs are usually used in parallel to gain power, these fast-switching speeds can lead to gate voltage oscillations across paralleled SiC chips, potentially leading to failures such as gate drive malfunction and gate oxide breakdown. This paper addresses the oscillation caused by source voltage fluctuations and unbalanced gate drive circuit characteristics. We propose a method to mitigate these issues using a symmetrical module structure which equalizes stray inductance between modules.

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Publication Details

Published
2025-03-16
DOI
https://doi.org/10.1109/apec48143.2025.10977265
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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article

Mitigating Gate Voltage Oscillation in Parallel SiC Power Modules for xEV

Mark Steiner, Junichi Nakashima, Yasushige Mukunoki, Ryotaro Yoneyama et al.
Silicon Carbide Semiconductor Technologies
article

Mitigating Gate Voltage Oscillation in Parallel SiC Power Modules for xEV

Mark Steiner, Junichi Nakashima, Yasushige Mukunoki, Ryotaro Yoneyama, Seiichiro Inokuchi, Eric R. Motto, Chihiro Kawahara, Michael J. Rogers, Koichi TAGUCHI, Hideo Komo
article en

Abstract

Global vehicle electrification is accelerating to combat global warming. Recently, Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are increasingly used in electric vehicle inverters for their low power loss at fast switching speeds compared to conventional Silicon Insulated Gate Bipolar Transistors (IGBTs). Although SiC MOSFETs are usually used in parallel to gain power, these fast-switching speeds can lead to gate voltage oscillations across paralleled SiC chips, potentially leading to failures such as gate drive malfunction and gate oxide breakdown. This paper addresses the oscillation caused by source voltage fluctuations and unbalanced gate drive circuit characteristics. We propose a method to mitigate these issues using a symmetrical module structure which equalizes stray inductance between modules.

Mitsubishi Electric (Japan) (JP), Mitsubishi Electric (United States) (US)
Affordable and clean energy
Openalex Percentile: Top 93%
Silicon Carbide Semiconductor Technologies
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Mitigating Gate Voltage Oscillation in Parallel SiC Power Modules for xEV — Mark Steiner, Junichi Nakashima, et al. · (2025) | TGRS Research Map | TGRS