Ultra-Fast 4H-SiC LGAD With Etched Termination and Field Plate
Silicon carbide Low Gain Avalanche Detectors (4H-SiC LGADs), exhibiting an ultra-fast time response and excellent time resolution, are reported. Via TCAD simulations, the use of field plates is proposed to suppress the high electric field caused by the negative bevel-etched angle. Experimental measurements confirm that the field plate significantly increases the breakdown voltage. Gain and time resolution are measured by using the ultraviolet transient current technique (UV-TCT), showing that 4H-SiC LGADs possess excellent timing performance, with a time resolution better than 35 ps in response to an injected laser signal tuned to represent a single minimum ionizing particle (MIP) at room temperature. Additionally, the gain suppression effect is observed in the 4H-SiC LGAD for the first time.
Authors
- Spyridon Pavlidis (ORCID: https://orcid.org/0000-0002-1690-2581)
- John F. Muth (ORCID: https://orcid.org/0000-0002-2488-7721)
- S. Holland (ORCID: https://orcid.org/0000-0001-7218-3457)
- Yashas Satapathy (ORCID: https://orcid.org/0000-0002-9859-2838)
- Philip Barletta
- C. Haber (ORCID: https://orcid.org/0000-0002-0155-1360)
- A. Tishelman-Charny
- Ben J. Sekely (ORCID: https://orcid.org/0009-0001-8894-1926)
- Tao Yang (ORCID: https://orcid.org/0000-0003-2161-5808)
- S. A. Stucci (ORCID: https://orcid.org/0000-0002-1639-4484)
- Greg Allion
- Gil Atar
Institutions
- North Carolina State University (US)
- Lawrence Berkeley National Laboratory (US)
- Brookhaven National Laboratory (US)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2025-03-05
- DOI
- https://doi.org/10.1109/led.2025.3548509
- Citations
- 3
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 2.19