Ultra-Fast 4H-SiC LGAD With Etched Termination and Field Plate

Silicon carbide Low Gain Avalanche Detectors (4H-SiC LGADs), exhibiting an ultra-fast time response and excellent time resolution, are reported. Via TCAD simulations, the use of field plates is proposed to suppress the high electric field caused by the negative bevel-etched angle. Experimental measurements confirm that the field plate significantly increases the breakdown voltage. Gain and time resolution are measured by using the ultraviolet transient current technique (UV-TCT), showing that 4H-SiC LGADs possess excellent timing performance, with a time resolution better than 35 ps in response to an injected laser signal tuned to represent a single minimum ionizing particle (MIP) at room temperature. Additionally, the gain suppression effect is observed in the 4H-SiC LGAD for the first time.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2025-03-05
DOI
https://doi.org/10.1109/led.2025.3548509
Citations
3
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
2.19
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article

Ultra-Fast 4H-SiC LGAD With Etched Termination and Field Plate

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3 citations
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article

Ultra-Fast 4H-SiC LGAD With Etched Termination and Field Plate

Spyridon Pavlidis, John F. Muth, S. Holland, Yashas Satapathy, Philip Barletta, C. Haber, A. Tishelman-Charny, Ben J. Sekely, Tao Yang, S. A. Stucci, Greg Allion, Gil Atar
article en
3 citations

Abstract

Silicon carbide Low Gain Avalanche Detectors (4H-SiC LGADs), exhibiting an ultra-fast time response and excellent time resolution, are reported. Via TCAD simulations, the use of field plates is proposed to suppress the high electric field caused by the negative bevel-etched angle. Experimental measurements confirm that the field plate significantly increases the breakdown voltage. Gain and time resolution are measured by using the ultraviolet transient current technique (UV-TCT), showing that 4H-SiC LGADs possess excellent timing performance, with a time resolution better than 35 ps in response to an injected laser signal tuned to represent a single minimum ionizing particle (MIP) at room temperature. Additionally, the gain suppression effect is observed in the 4H-SiC LGAD for the first time.

IEEE Electron Device LettersVol. 46(5)
North Carolina State University (US), Lawrence Berkeley National Laboratory (US), Brookhaven National Laboratory (US)
Openalex Percentile: Top 12%
Silicon Carbide Semiconductor Technologies
2.19
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Ultra-Fast 4H-SiC LGAD With Etched Termination and Field Plate — Spyridon Pavlidis, John F. Muth, et al. · IEEE Electron Device Letters (2025) | TGRS Research Map | TGRS