Measurement Techniques for Magnetic Circuits Using SiC/GaN Devices

Authors

Publication Details

Journal
The Journal of the Institute of Electrical Engineers of Japan
Published
2025-05-01
DOI
https://doi.org/10.1541/ieejjournal.145.254
Citations
1
Primary Topic
Magnetic Field Sensors Techniques
Type
article
Field-Weighted Citation Impact
0.73
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article

Measurement Techniques for Magnetic Circuits Using SiC/GaN Devices

Ryu Nagahama
1 citations
The Journal of the Institute of Electrical Engineers of Japan
Magnetic Field Sensors Techniques
0.73
article

Measurement Techniques for Magnetic Circuits Using SiC/GaN Devices

Ryu Nagahama
article en
1 citations

Abstract

No abstract available for this paper.
The Journal of the Institute of Electrical Engineers of JapanVol. 145(5)
Affordable and clean energy
Openalex Percentile: Top 29%
Magnetic Field Sensors Techniques
0.73
DOISourceOpenAlex
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Measurement Techniques for Magnetic Circuits Using SiC/GaN Devices — Ryu Nagahama · The Journal of the Institute of Electrical Engineers of Japan (2025) | TGRS Research Map | TGRS