Chip Resistors based on the Alloy X20N75YU and Kermets K-30S with an Additional Compensation Layer

The purpose of the work is to develop the design and technological process of manufacturing multilayer and combined thin-film surface-mounted resistors with additional compensation layers. The objectives of the study are: the selection of materials and their thicknesses, which are able to compensate each other according to the parameters of the TCS. For this purpose, pairs of X20H75YU/K-30C, as well as K-30C/Ni were used. Topologies for combined and multilayer TPR with a nominal value of 10 kOhm are proposed. The initial data were calculations of the resistances of thin films for both cases. According to the parameters measurements results of the temperature stability of the resistance for —60 °C and 125 °C, aging curves are constructed. It is shown that the measurement results and the proposed design and technological solution make it possible to obtain thin-film chip resistors having a TCS of at least ±5 ×10—7 1/°C in the operating temperature range from —60 °C to +125 °C. The results obtained can be used in scientific research and in industry in the development of a component-electronic database.

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Publication Details

Journal
Nano- i Mikrosistemnaya Tehnika
Published
2025-02-19
DOI
https://doi.org/10.17587/nmst.27.3-7
Primary Topic
Material Properties and Applications
Type
article
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article

Chip Resistors based on the Alloy X20N75YU and Kermets K-30S with an Additional Compensation Layer

П. О. Гурін, E.A. Pecherskaya, S. A. Gurin, Anastasia E. Shepeleva et al.
Nano- i Mikrosistemnaya Tehnika
Material Properties and Applications
article

Chip Resistors based on the Alloy X20N75YU and Kermets K-30S with an Additional Compensation Layer

П. О. Гурін, E.A. Pecherskaya, S. A. Gurin, Anastasia E. Shepeleva, M. D. Novichkov, V.S. Mamontov
article en

Abstract

The purpose of the work is to develop the design and technological process of manufacturing multilayer and combined thin-film surface-mounted resistors with additional compensation layers. The objectives of the study are: the selection of materials and their thicknesses, which are able to compensate each other according to the parameters of the TCS. For this purpose, pairs of X20H75YU/K-30C, as well as K-30C/Ni were used. Topologies for combined and multilayer TPR with a nominal value of 10 kOhm are proposed. The initial data were calculations of the resistances of thin films for both cases. According to the parameters measurements results of the temperature stability of the resistance for —60 °C and 125 °C, aging curves are constructed. It is shown that the measurement results and the proposed design and technological solution make it possible to obtain thin-film chip resistors having a TCS of at least ±5 ×10—7 1/°C in the operating temperature range from —60 °C to +125 °C. The results obtained can be used in scientific research and in industry in the development of a component-electronic database.

Nano- i Mikrosistemnaya TehnikaVol. 27(1)
Openalex Percentile: Top 86%
Material Properties and Applications
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