A Quantile-Based Approach for Testing Exponentiality Against DMTTF Alternatives

In this article, we introduce a family of nonparameteric tests for exponentiality against alternatives from the decreasing mean time to failure family, employing the quantile-based formulation of the mean time to failure function. We derive the exact null distribution for the proposed family of test statistics and establish their consistency and asymptotic normality. To evaluate the performance of the test, we compare it with existing tests through Monte Carlo simulations. Finally, we utilize real-world data to illustrate the implementation of our test.

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Publication Details

Journal
IEEE Transactions on Reliability
Published
2025-04-29
DOI
https://doi.org/10.1109/tr.2025.3560678
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

A Quantile-Based Approach for Testing Exponentiality Against DMTTF Alternatives

Shyamal Ghosh, Koushik Das
IEEE Transactions on Reliability
VLSI and Analog Circuit Testing
article

A Quantile-Based Approach for Testing Exponentiality Against DMTTF Alternatives

Shyamal Ghosh, Koushik Das
article en

Abstract

In this article, we introduce a family of nonparameteric tests for exponentiality against alternatives from the decreasing mean time to failure family, employing the quantile-based formulation of the mean time to failure function. We derive the exact null distribution for the proposed family of test statistics and establish their consistency and asymptotic normality. To evaluate the performance of the test, we compare it with existing tests through Monte Carlo simulations. Finally, we utilize real-world data to illustrate the implementation of our test.

IEEE Transactions on ReliabilityVol. 74(4)
Indian Institute of Science Education and Research Thiruvananthapuram (IN)
Openalex Percentile: Top 93%
VLSI and Analog Circuit Testing
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