Materials and Evaluation Methodology of Pogo Pin for Semiconductor Package Testing

Advancements in semiconductor packaging technology have increased the demand for precise testing equipment. Pogo pins play a crucial role in semiconductor package inspection systems by providing reliable electrical connectivity during testing. However, as semiconductor circuits become increasingly fine-pitched, pogo pins must be reduced in size and diameter. This reduction makes it challenging to balance mechanical durability with electrical performance. Particularly with the rise of high-frequency components, developing pogo pins that minimize interference with high-frequency measurements is becoming essential.This review examines recent developments in pogo pin technology for semiconductor package inspection. Pogo pins are classified based on their materials and structural designs, analyzing how these factors impact reliability and electrical measurement accuracy. Mechanical properties, such as hardness and wear characteristics, and electrical properties, including contact resistance and impedance, are also thoroughly explored. Based on these findings, an optimized pogo pin design strategy is proposed, focusing on enhanced durability and improved testing accuracy for semiconductor packages.

Authors

Publication Details

Journal
Journal of Welding and Joining
Published
2025-04-29
DOI
https://doi.org/10.5781/jwj.2025.43.2.3
Citations
2
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
1.46

Funders

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article

Materials and Evaluation Methodology of Pogo Pin for Semiconductor Package Testing

Mi-Song Kim, Won Sik Hong, Chihun In, Jeong Tak Moon et al.
2 citations
Journal of Welding and Joining
Integrated Circuits and Semiconductor Failure Analysis
1.46
article

Materials and Evaluation Methodology of Pogo Pin for Semiconductor Package Testing

Mi-Song Kim, Won Sik Hong, Chihun In, Jeong Tak Moon, Yong-Jun Kim
article en
2 citations

Abstract

Advancements in semiconductor packaging technology have increased the demand for precise testing equipment. Pogo pins play a crucial role in semiconductor package inspection systems by providing reliable electrical connectivity during testing. However, as semiconductor circuits become increasingly fine-pitched, pogo pins must be reduced in size and diameter. This reduction makes it challenging to balance mechanical durability with electrical performance. Particularly with the rise of high-frequency components, developing pogo pins that minimize interference with high-frequency measurements is becoming essential.This review examines recent developments in pogo pin technology for semiconductor package inspection. Pogo pins are classified based on their materials and structural designs, analyzing how these factors impact reliability and electrical measurement accuracy. Mechanical properties, such as hardness and wear characteristics, and electrical properties, including contact resistance and impedance, are also thoroughly explored. Based on these findings, an optimized pogo pin design strategy is proposed, focusing on enhanced durability and improved testing accuracy for semiconductor packages.

Journal of Welding and JoiningVol. 43(2)
Ministry of Trade, Industry and Energy
Openalex Percentile: Top 18%
Integrated Circuits and Semiconductor Failure Analysis
1.46
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