Anisotropic optical path model for characterizing statistics of scattered field

A model that captures the statistical properties of the scattered light field can offer a physical explanation and computational support for designing and evaluating imaging schemes. Here, we propose an Anisotropic Optical Path (AOP) model that incorporates statistics of different optical paths affected by scattering, with photons involved in different processes. The model enables simulation of a limited field of view (FOV) constrained by the memory effect. It also reflects spectral differences under broadband illumination, thereby enhancing its applicability for light field simulation in higher degrees of freedom. Due to the decorrelation trend of speckle patterns at different wavelengths, the model verifies the feasibility of using scattering media as spectral filters.

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Publication Details

Journal
Optics Express
Published
2025-04-28
DOI
https://doi.org/10.1364/oe.560952
Primary Topic
Surface Roughness and Optical Measurements
Type
article
Field-Weighted Citation Impact
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article

Anisotropic optical path model for characterizing statistics of scattered field

Zhen-Wu Nie, Yue Li, Wei-Tao Liu, Bao Ke et al.
Optics Express
Surface Roughness and Optical Measurements
article

Anisotropic optical path model for characterizing statistics of scattered field

Zhen-Wu Nie, Yue Li, Wei-Tao Liu, Bao Ke, Shuai Sun
article en

Abstract

A model that captures the statistical properties of the scattered light field can offer a physical explanation and computational support for designing and evaluating imaging schemes. Here, we propose an Anisotropic Optical Path (AOP) model that incorporates statistics of different optical paths affected by scattering, with photons involved in different processes. The model enables simulation of a limited field of view (FOV) constrained by the memory effect. It also reflects spectral differences under broadband illumination, thereby enhancing its applicability for light field simulation in higher degrees of freedom. Due to the decorrelation trend of speckle patterns at different wavelengths, the model verifies the feasibility of using scattering media as spectral filters.

Optics ExpressVol. 33(10)
Shanghai Jiao Tong University (CN)
Openalex Percentile: Top 90%
Surface Roughness and Optical Measurements
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