Efficient Polymer Functionalization by Means of Extreme Ultraviolet

Abstract Extreme ultraviolet (XUV) radiation is highly efficient for functionalization of solid materials by means of pronounced radical formation. To prevent collective effects, and study single photon effects, a low‐fluence XUV source with 200 μJ/cm 2 was used to irradiate polymers such as poly‐methyl methacrylate (PMMA) and poly‐tetrafluoroethylene (PTFE). The unexposed and XUV‐exposed sample domains were analyzed with time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), Fourier transform infrared spectroscopy (FT‐IR), and X‐ray photoelectron spectroscopy (XPS). The findings show that XUV photons drive photochemical modification of the surface, fragmentation, and ionization of the desorbed products. Besides a theoretical analysis, the XUV‐induced surface modification of PTFE is discussed a new application for surface functionalization.

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Publication Details

Journal
Helvetica Chimica Acta
Published
2025-04-26
DOI
https://doi.org/10.1002/hlca.202400100
Citations
1
Primary Topic
Advancements in Photolithography Techniques
Type
article
Field-Weighted Citation Impact
0.73
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article

Efficient Polymer Functionalization by Means of Extreme Ultraviolet

Di Qu, Davide Bleiner, Léonard Bezinge, Claudia Masucci et al.
1 citations
Helvetica Chimica Acta
Advancements in Photolithography Techniques
0.73
article

Efficient Polymer Functionalization by Means of Extreme Ultraviolet

Di Qu, Davide Bleiner, Léonard Bezinge, Claudia Masucci, Minglei Wang, Filippo Longo, Jing Wang, Celine Hensky, Mirushe Suloska
article en
1 citations

Abstract

Abstract Extreme ultraviolet (XUV) radiation is highly efficient for functionalization of solid materials by means of pronounced radical formation. To prevent collective effects, and study single photon effects, a low‐fluence XUV source with 200 μJ/cm 2 was used to irradiate polymers such as poly‐methyl methacrylate (PMMA) and poly‐tetrafluoroethylene (PTFE). The unexposed and XUV‐exposed sample domains were analyzed with time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), Fourier transform infrared spectroscopy (FT‐IR), and X‐ray photoelectron spectroscopy (XPS). The findings show that XUV photons drive photochemical modification of the surface, fragmentation, and ionization of the desorbed products. Besides a theoretical analysis, the XUV‐induced surface modification of PTFE is discussed a new application for surface functionalization.

Helvetica Chimica ActaVol. 108(5)
University of Zurich (CH), Swiss Federal Laboratories for Materials Science and Technology (CH)
Openalex Percentile: Top 29%
Advancements in Photolithography Techniques
0.73
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Efficient Polymer Functionalization by Means of Extreme Ultraviolet — Di Qu, Davide Bleiner, et al. · Helvetica Chimica Acta (2025) | TGRS Research Map | TGRS