Improvement of Performance of Cu <sub>2</sub> ZnSn(S,Se) <sub>4</sub> Solar Cells by Adding SiN <sub> <i>x</i> </sub> Buffer Layer and Optimizing its Position and Thickness
Many results have demonstrated that high interfacial recombination is one of the main leading to low power conversion efficiency (PCE) of Cu 2 ZnSn(S,Se) 4 (CZTSSe). Herein, interfacial recombination of CZTSSe solar cell by addition of silicon nitride (SiN x ) buffer layer in front interface of CdS/CZTSSe and back interface of CZTSSe/Mo is reduced. It is found that the PCE decreases sharply when the SiN x layer is deposited at the front interface. Quantitative analysis indicates that the decreased PCE is mainly attributed to the decrease in photogeneration density ( J L ), followed by increase in reverse saturation current density ( J 0 ). However, when the SiN x layer is deposited at the back interface, the PCE increases from 9.11 to 9.78% as the thickness of the SiN x increases from 0 to 5 nm. Quantitative analysis indicates that the increased PCE is mainly attributed to the increase in J L , followed by the decrease in J 0 and series resistance ( R s ). This work provides a reference for the study of using SiN x passivation to improve the efficiency of CZTSSe or other solar cells.
Authors
- Yuting Sun (ORCID: https://orcid.org/0000-0002-0975-7902)
- Chunkai Wang
- Zhanhui Ding (ORCID: https://orcid.org/0000-0001-6921-0733)
- Guochao Yan (ORCID: https://orcid.org/0009-0001-9491-6911)
- Yongfeng Li (ORCID: https://orcid.org/0000-0002-9725-0692)
- Bin Yao (ORCID: https://orcid.org/0000-0003-0748-3220)
- Jiayong Zhang (ORCID: https://orcid.org/0000-0003-0018-1131)
- Mengge Li (ORCID: https://orcid.org/0000-0003-2123-5987)
- Yongqin Hao
Institutions
- Changchun University of Science and Technology (CN)
- Jilin University (CN)
- State Key Laboratory of High Pressure and Superhard Materials (CN)
Publication Details
- Journal
- Energy Technology
- Published
- 2025-04-26
- DOI
- https://doi.org/10.1002/ente.202500083
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Natural Science Foundation of Jilin Province
- National Natural Science Foundation of China
- Jilin University