Magnetic non-destructive evaluation of the silicon distribution in a Si-gradient silicon steel lamination
Authors
- Tetsuya Uchimoto (ORCID: https://orcid.org/0000-0002-0579-0983)
- Yves Armand Tene Deffo (ORCID: https://orcid.org/0000-0001-8825-5611)
- Benjamin Ducharne
Institutions
- Université Claude Bernard Lyon 1 (FR)
- University of Buea (CM)
- Tohoku University (JP)
- Institut National des Sciences Appliquées de Lyon (FR)
Publication Details
- Journal
- Nondestructive Testing And Evaluation
- Published
- 2025-04-25
- DOI
- https://doi.org/10.1080/10589759.2025.2496801
- Primary Topic
- Magnetic Properties and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00