Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device

Fractional-order capacitors can potentially be fabricated using MOS technologies taking advantage of their distributed resistive-capacitive structure. However, there are limited models to simulate the characteristics of these designs. In this work, an equivalent circuit model to represent a finite-element of a MOS structure is used to assemble a hierarchical model of a complete design in LTspice. This equivalent circuit model is validated (for designs with phases of -77°, -74°, -58°, and -53° with a maximum of ±2° tolerance) against previously established matrix model representations. Using this validated model varying gate length connections (from 100% to 6.25%) caused deviations less than 0.25° supporting that this characteristic of MOS technologies is not likely to have a significant effect on fabricated designs.

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Publication Details

Published
2025-03-22
DOI
https://doi.org/10.1109/southeastcon56624.2025.10971518
Citations
1
Primary Topic
Magnetic Bearings and Levitation Dynamics
Type
article
Field-Weighted Citation Impact
1.21

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article

Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device

Todd J. Freeborn, David Kubánek, Lauryn A. Prokup
1 citations
Magnetic Bearings and Levitation Dynamics
1.21
article

Finite Element Model in LTspice of a Distributed RC-Structure Fractional-Order Capacitor Device

Todd J. Freeborn, David Kubánek, Lauryn A. Prokup
article en
1 citations

Abstract

Fractional-order capacitors can potentially be fabricated using MOS technologies taking advantage of their distributed resistive-capacitive structure. However, there are limited models to simulate the characteristics of these designs. In this work, an equivalent circuit model to represent a finite-element of a MOS structure is used to assemble a hierarchical model of a complete design in LTspice. This equivalent circuit model is validated (for designs with phases of -77°, -74°, -58°, and -53° with a maximum of ±2° tolerance) against previously established matrix model representations. Using this validated model varying gate length connections (from 100% to 6.25%) caused deviations less than 0.25° supporting that this characteristic of MOS technologies is not likely to have a significant effect on fabricated designs.

University of Alabama (US), Brno University of Technology (CZ)
National Science Foundation, Grantová Agentura České Republiky
Openalex Percentile: Top 22%
Magnetic Bearings and Levitation Dynamics
1.21
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