Yield Analysis and Fault Isolation With Artificial Intelligence (AI) in Semiconductor Industry

Each day, the semiconductor industry is facing challenges lowering the technology node. The processing speed and power are key determining factors of semiconductor technology. To keep up with speed and performance, the pitch of technology always needs to shrink. As the feature size of a technology is decreased, the failure rate of various semiconductor devices increases, even the device loses its characteristics, and the device yield is affected severely. Nowadays, maintaining the production yield becomes more challenging and isolation of faults behind poor yield also becomes a nightmare. This work tries to explore the possible use of Artificial Intelligence (AI) in yield analysis and fault isolation to solve these challenges.