Advanced electrical and thermal scanning probe lithography for next-generation nanodevice fabrication

Scanning probe lithography (SPL) offers a variety of physical and chemical techniques for surface modification, enabling the fabrication of customized, functional nanoscale features. These methods provide unmatched resolution, repeatability, and operational simplicity compared to other lithographic techniques. This paper reviews recent advancements in SPL driven by electrical and thermal effects, highlighting how these approaches address the fabrication of functional nanostructures. These advancements pave the way for next-generation nanotechnological applications, including single-dopant atomic devices, memristors, metasurfaces, nanofluidic devices, and more.

Authors

Institutions

Publication Details

Published
2025-04-25
DOI
https://doi.org/10.1117/12.3049277
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Advanced electrical and thermal scanning probe lithography for next-generation nanodevice fabrication

Xichun Luo, Wenkun Xie, Jian Gao
Force Microscopy Techniques and Applications
article

Advanced electrical and thermal scanning probe lithography for next-generation nanodevice fabrication

Xichun Luo, Wenkun Xie, Jian Gao
article en

Abstract

Scanning probe lithography (SPL) offers a variety of physical and chemical techniques for surface modification, enabling the fabrication of customized, functional nanoscale features. These methods provide unmatched resolution, repeatability, and operational simplicity compared to other lithographic techniques. This paper reviews recent advancements in SPL driven by electrical and thermal effects, highlighting how these approaches address the fabrication of functional nanostructures. These advancements pave the way for next-generation nanotechnological applications, including single-dopant atomic devices, memristors, metasurfaces, nanofluidic devices, and more.

University of Strathclyde (GB)
Openalex Percentile: Top 93%
Force Microscopy Techniques and Applications
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.