Transient studies using a TCAD and Allpix Squared combination approach

The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic density and overall lower power consumption compared to previously used processes. A combination of Technology Computer-Aided Design (TCAD) and Monte Carlo (MC) simulations are used to understand the physical processes within the sensing element and thus the overall performance of the pixel detector. The response of the sensors can then be tested in laboratory and test beam facilities and compared to simulation results. Transient simulations allow for studying the response of the sensor over time, such as the signal produced after a charged particle passes through the sensor. The study of these signals is important to understand the magnitude and timing of the response from the sensors and improve upon them. While TCAD simulations are accurate, the time required to produce a single pulse is large compared to a combination of MC and TCAD simulations. In this work, a validation of the transient simulation approach and studies on charge collection are presented.

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Publication Details

Published
2025-04-24
DOI
https://doi.org/10.22323/1.468.0104
Primary Topic
Electromagnetic Compatibility and Measurements
Type
article
Field-Weighted Citation Impact
0.00

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article

Transient studies using a TCAD and Allpix Squared combination approach

W. Snoeys, Daniil Rastorguev, P. Schütze, Judith Schlaadt et al.
Electromagnetic Compatibility and Measurements
article

Transient studies using a TCAD and Allpix Squared combination approach

W. Snoeys, Daniil Rastorguev, P. Schütze, Judith Schlaadt, Adriana Simancas, K. Hansen, Budi Mulyanto, Gianpiero Vignola, Simon Spannagel, D. Dannheim, Finn Feindt, Lennart Huth, Sara Ruiz Daza, I. M. Gregor, Larissa Mendes, Anastasiia Velyka, D. Eckstein, Håkan Wennlöf, Christian Reckleben, K. Dort, Ankur Chauhan, M. M. Stanitzki, E. Buschmann, Yajun He, Manuel Alejandro Del Rio Viera
article en

Abstract

The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic density and overall lower power consumption compared to previously used processes. A combination of Technology Computer-Aided Design (TCAD) and Monte Carlo (MC) simulations are used to understand the physical processes within the sensing element and thus the overall performance of the pixel detector. The response of the sensors can then be tested in laboratory and test beam facilities and compared to simulation results. Transient simulations allow for studying the response of the sensor over time, such as the signal produced after a charged particle passes through the sensor. The study of these signals is important to understand the magnitude and timing of the response from the sensors and improve upon them. While TCAD simulations are accurate, the time required to produce a single pulse is large compared to a combination of MC and TCAD simulations. In this work, a validation of the transient simulation approach and studies on charge collection are presented.

CERN, European Commission, Bundesministerium für Bildung und Forschung, Deutsches Elektronen-Synchrotron
Openalex Percentile: Top 93%
Electromagnetic Compatibility and Measurements
DOIOpen Access PDFOpenAlex
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