K shell fluorescence parameters of low atomic numbered transition elements using Au-Lα X-rays

In this study, Au-L α characteristic X-rays are employed to excite K shell electrons of elements Cr, Mn, Fe, Co, Ni, Cu, and Zn. A reflection geometry setup is utilized, and counts are recorded using a Si-PIN detector with enough time for a statistical standard deviation of 10 %. From the spectra of counts versus energy, fluorescence parameters, including K shell fluorescence yield, cross section, intensity ratio, and K to L vacancy transfer probability are computed. These values are then compared with existing experimental and theoretical data to evaluate their accuracy and consistency. • K shell fluorescence parameters are calculated using Si-PIN detector. • Au-Lα characteristic X-rays (9.68 keV) are used for excitation. • K to L vacancy transfer probabilities is derived from the obtained data. • The obtained results are compared with others works for elements with 24≤Z ≤ 30.