Multi-scan structured illumination microscopy for rapid and efficient volumetric super-resolution imaging
Structured illumination microscopy (SIM) is a widely adopted super-resolution imaging technique. Conventional 3D-SIM requires at least 15 exposures at each z-plane to achieve ∼2 × improved lateral and axial resolution. However, this requirement for a large number of exposures for "super-resolution" exacerbates photobleaching and slows imaging speed, thus significantly limiting its application in volumetric biological imaging. Here, we introduce multi-scan SIM (MS-SIM) that integrates a simple beam splitter for simultaneously imaging three different focal planes and a deformable mirror that enables rapid z-scanning over three contiguous sub-volumes. We demonstrate the MS-SIM system through high-quality live whole cell SIM imaging at ∼1 Hz. The high efficiency and flexibility of MS-SIM can significantly impact 3D super-resolution imaging of biological and dense colloidal systems.
Authors
- Chufan Cai (ORCID: https://orcid.org/0000-0001-6209-0820)
- Daozheng Gong (ORCID: https://orcid.org/0000-0002-3951-1890)
- Norbert F. Scherer (ORCID: https://orcid.org/0000-0002-9425-8234)
- Patrick J. La Rivière (ORCID: https://orcid.org/0000-0003-3415-9864)
- Jing Chen (ORCID: https://orcid.org/0000-0001-6703-2486)
- Geneva Anderberg
Institutions
- University of Chicago (US)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-04-24
- DOI
- https://doi.org/10.1364/ol.558505
- Citations
- 1
- Primary Topic
- Advanced Fluorescence Microscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.63
Funders
- University of Chicago