P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry

Beamline P21.1 at PETRA III uses high-energy photons for the investigation of materials structure by diffraction methods. The instrumentation is particularly suited for probing ordering phenomena on a local scale in chemistry and physics. A detailed description of the instrumentation and detectors for such experiments is given. The beamline supports a number of sample environments for investigations under in situ and operando conditions, e.g. cryostats, furnaces, chemical reactors. Recent examples of measurements on amorphous, single-crystalline and thin film samples are described.

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Publication Details

Journal
Journal of Synchrotron Radiation
Published
2025-04-22
DOI
https://doi.org/10.1107/s1600577525002826
Citations
9
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
4.66

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article

P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry

A. Schöps, Olof Gutowski, Oleh Ivashko, Philipp Glaevecke et al.
9 citations
Journal of Synchrotron Radiation
X-ray Diffraction in Crystallography
4.66
article

P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry

A. Schöps, Olof Gutowski, Oleh Ivashko, Philipp Glaevecke, Robert Nowak, Fernando Igoa, B. Winkler, Ann‐Christin Dippel, Jiatu Liu, M. v. Zimmermann, Horst Schulte-Schrepping, Katrin Köhler
article en
9 citations

Abstract

Beamline P21.1 at PETRA III uses high-energy photons for the investigation of materials structure by diffraction methods. The instrumentation is particularly suited for probing ordering phenomena on a local scale in chemistry and physics. A detailed description of the instrumentation and detectors for such experiments is given. The beamline supports a number of sample environments for investigations under in situ and operando conditions, e.g. cryostats, furnaces, chemical reactors. Recent examples of measurements on amorphous, single-crystalline and thin film samples are described.

Journal of Synchrotron RadiationVol. 32(3)
Goethe University Frankfurt (DE), Deutsches Elektronen-Synchrotron DESY (DE)
Bundesministerium für Bildung und Forschung
Affordable and clean energy
Openalex Percentile: Top 5%
X-ray Diffraction in Crystallography
4.66
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P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry — A. Schöps, Olof Gutowski, et al. · Journal of Synchrotron Radiation (2025) | TGRS Research Map | TGRS