Learning Self-Supervised Representations of Powder-Diffraction Patterns

The potential of machine learning (ML) models for predicting crystallographic symmetry information from single-phase powder X-ray diffraction (XRD) patterns is investigated. Given the scarcity of large, labeled experimental datasets, we train our models using simulated XRD patterns generated from crystallographic databases. A key challenge in developing reliable diffraction-based structure-solution tools lies in the limited availability of training data and the presence of natural adversarial examples, which hinder model generalization. To address these issues, we explore multiple training pipelines and testing strategies, including evaluations on experimental XRD data. We introduce a contrastive representation learning approach that significantly outperforms previous supervised learning models in terms of robustness and generalizability, demonstrating improved invariance to experimental effects. These results highlight the potential of self-supervised learning in advancing ML-driven crystallographic analysis.

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Publication Details

Journal
Crystals
Published
2025-04-23
DOI
https://doi.org/10.3390/cryst15050393
Citations
3
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
1.55

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article

Learning Self-Supervised Representations of Powder-Diffraction Patterns

Shubhayu Das, Richard Dronskowski, Andreas Houben, Markus Vorholt
3 citations
Crystals
X-ray Diffraction in Crystallography
1.55
article

Learning Self-Supervised Representations of Powder-Diffraction Patterns

Shubhayu Das, Richard Dronskowski, Andreas Houben, Markus Vorholt
article en
3 citations

Abstract

The potential of machine learning (ML) models for predicting crystallographic symmetry information from single-phase powder X-ray diffraction (XRD) patterns is investigated. Given the scarcity of large, labeled experimental datasets, we train our models using simulated XRD patterns generated from crystallographic databases. A key challenge in developing reliable diffraction-based structure-solution tools lies in the limited availability of training data and the presence of natural adversarial examples, which hinder model generalization. To address these issues, we explore multiple training pipelines and testing strategies, including evaluations on experimental XRD data. We introduce a contrastive representation learning approach that significantly outperforms previous supervised learning models in terms of robustness and generalizability, demonstrating improved invariance to experimental effects. These results highlight the potential of self-supervised learning in advancing ML-driven crystallographic analysis.

CrystalsVol. 15(5)
RWTH Aachen University (DE)
Deutsche Forschungsgemeinschaft
Openalex Percentile: Top 18%
X-ray Diffraction in Crystallography
1.55
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