Design of a Polyvalent Test Platform for Evaluation of Self-Sustained Oscillation in Multi-chip Power Modules

This study introduces a polyvalent test platform to investigate self-sustained oscillation (SSO) in parallel-connected Silicon Carbide (SiC) MOSFETs. Examining the oscillatory behavior associated with SiC multi-chip modules, this work uses an LTspice simulation framework and presents an analysis of parameters influencing SSOs. The study employs a Monte Carlo simulation to explore various circuit configurations and their susceptibility to SSO, offering insights into parameter importance.