Pattern Matching-Based Denoising for Images with Repeated Sub-Structures

In electron microscopy, obtaining low-noise images is often difficult, especially when examining biological samples or delicate materials. Therefore, the suppression of noise is essential for the analysis of such noisy images. State-of-the-art image denoising methods are dominated by supervised Convolution neural network (CNN)-based methods. However, supervised CNNs cannot be used if a noise-free ground truth is unavailable. To address this problem, we propose a method that uses re-occurring patterns in images. Our proposed method does not require noise-free images for the denoising task. Instead, it is based on the idea that averaging images with the same signal having independent noise suppresses the overall noise. In order to evaluate the performance of our method, we compare our results with other state-of-the-art denoising methods that do not require a noise-free image. We show that our method is the best for retaining fine image structures. Additionally, we develop a confidence map for evaluating the denoising quality of the proposed method. Furthermore, we analyze the time complexity of the algorithm to ensure scalability and optimize the algorithm to improve the runtime efficiency.