VLSI Architecture for Edge Detection of Leaf Images

This paper proposed a new VLSI Architecture for Sobel Edge detector for Cotton and Grape leaf images. This new VLSI Architecture is tested for leaf images using Verilog HDL and Simulated and Synthesized using Xilinx Vivado tool and results shown the low power and low area, utilized less than 0.01% of LUTs and 0.13 w of power only. The same architecture is also extended for Prewitt and Laplace Edge detectors and results shown that utility of power and area is less.

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Publication Details

Journal
Transactions on Engineering and Computing Sciences
Published
2025-04-16
DOI
https://doi.org/10.14738/tecs.1302.18612
Primary Topic
Leaf Properties and Growth Measurement
Type
article
Field-Weighted Citation Impact
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article

VLSI Architecture for Edge Detection of Leaf Images

T. Satya Savithri, G. Sukanya
Transactions on Engineering and Computing Sciences
Leaf Properties and Growth Measurement
article

VLSI Architecture for Edge Detection of Leaf Images

T. Satya Savithri, G. Sukanya
article en

Abstract

This paper proposed a new VLSI Architecture for Sobel Edge detector for Cotton and Grape leaf images. This new VLSI Architecture is tested for leaf images using Verilog HDL and Simulated and Synthesized using Xilinx Vivado tool and results shown the low power and low area, utilized less than 0.01% of LUTs and 0.13 w of power only. The same architecture is also extended for Prewitt and Laplace Edge detectors and results shown that utility of power and area is less.

Transactions on Engineering and Computing SciencesVol. 13(02)
Jawaharlal Nehru Technological University, Hyderabad (IN)
Openalex Percentile: Top 94%
Leaf Properties and Growth Measurement
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