Advanced coater/developer technologies towards high-NA EUV production volume manufacturing
In this paper, I present improved EUV patterning performance by optimizing CAR and MOR coater/developer processes (and their respective etch transfers) to meet the challenges of high NA EUV mass production. We will discuss the challenges and solutions associated with extending CAR for a first-generation high NA EUV process, as well as proposed mass-production ready solutions for MOR
Authors
- Tetsunari Furusho
Institutions
- Tokyo Electron (Japan) (JP)
Publication Details
- Published
- 2025-04-22
- DOI
- https://doi.org/10.1117/12.3051184
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00