Shadow-Assisted Sidewall Emission for Achieving Submicron Linewidth Light Source by Using Normal UV Photolithography

Micro light sources are crucial tools for studying the interactions between light and matter at the micro/nanoscale, encompassing diverse applications across multiple disciplines. Despite numerous studies on reducing the size of micro light sources and enhancing optical resolution, the efficient and simple fabrication of ultra-high-resolution micro light sources remains challenging due to its reliance on precise micro-nano processing technology and advanced processing equipment. In this study, a simple approach for the efficient fabrication of submicron light sources is proposed, namely shadow-assisted sidewall emission (SASE) technology. The SASE utilizes the widely adopted UV photolithography process, employing metal shadow modulation to precisely control the emission of light from polymer sidewalls, thereby obtaining photoluminescent light sources with submicron line widths. The SASE eliminates the need for complex and cumbersome manufacturing procedures. The effects of process parameters, including exposure dose, development time, and metal film thickness, on the linewidth of sources are investigated on detail. It is successfully demonstrated red, green, and blue submicron light sources. Finally, their potential application in the field of optical anti-counterfeiting is also demonstrated. We believe that the SASE proposed in this work provides a novel approach for the preparation and application of micro light sources.

Authors

Institutions

Publication Details

Journal
Nano-Micro Letters
Published
2025-04-22
DOI
https://doi.org/10.1007/s40820-025-01737-w
Primary Topic
Nanofabrication and Lithography Techniques
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Shadow-Assisted Sidewall Emission for Achieving Submicron Linewidth Light Source by Using Normal UV Photolithography

Yanming Guo, Xiongtu Zhou, Chaoxing Wu, Hao Su et al.
Nano-Micro Letters
Nanofabrication and Lithography Techniques
article

Shadow-Assisted Sidewall Emission for Achieving Submicron Linewidth Light Source by Using Normal UV Photolithography

Yanming Guo, Xiongtu Zhou, Chaoxing Wu, Hao Su, Wei Huang, Wenhao Li, Junlong Li, Yongai Zhang, Tailiang Guo, Kun Wang
article en

Abstract

Micro light sources are crucial tools for studying the interactions between light and matter at the micro/nanoscale, encompassing diverse applications across multiple disciplines. Despite numerous studies on reducing the size of micro light sources and enhancing optical resolution, the efficient and simple fabrication of ultra-high-resolution micro light sources remains challenging due to its reliance on precise micro-nano processing technology and advanced processing equipment. In this study, a simple approach for the efficient fabrication of submicron light sources is proposed, namely shadow-assisted sidewall emission (SASE) technology. The SASE utilizes the widely adopted UV photolithography process, employing metal shadow modulation to precisely control the emission of light from polymer sidewalls, thereby obtaining photoluminescent light sources with submicron line widths. The SASE eliminates the need for complex and cumbersome manufacturing procedures. The effects of process parameters, including exposure dose, development time, and metal film thickness, on the linewidth of sources are investigated on detail. It is successfully demonstrated red, green, and blue submicron light sources. Finally, their potential application in the field of optical anti-counterfeiting is also demonstrated. We believe that the SASE proposed in this work provides a novel approach for the preparation and application of micro light sources.

Nano-Micro LettersVol. 17(1)
Tan Kah Kee Innovation Laboratory (CN)
Openalex Percentile: Top 92%
Nanofabrication and Lithography Techniques
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.