Comparative Failure Rate Analysis of Dual Input Boost Converters

This paper proposes comparative analysis on the failure rate of the boost (BC) and the dual input interleaved boost converter (DIIBC) in accordance with the Military (MIL) handbook. Initially, the power loss and efficiency of both the converters are evaluated for the power rating of 1 kW under its normal operating conditions, and stress factor analysis is also tabulated. The failure rate of the power electronic components that are prone to failure using the MIL handbook is calculated and compared in the table. The results show that the dual input interleaved boost converter provides high reliability, power source stress, power source redundancy, high efficiency, low component stress, and scalability.

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Published
2025-02-21
DOI
https://doi.org/10.1109/icidea64800.2025.10963138
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Comparative Failure Rate Analysis of Dual Input Boost Converters

A Lavanya, J. Divya Navamani, N V Sivaram
Radiation Effects in Electronics
article

Comparative Failure Rate Analysis of Dual Input Boost Converters

A Lavanya, J. Divya Navamani, N V Sivaram
article en

Abstract

This paper proposes comparative analysis on the failure rate of the boost (BC) and the dual input interleaved boost converter (DIIBC) in accordance with the Military (MIL) handbook. Initially, the power loss and efficiency of both the converters are evaluated for the power rating of 1 kW under its normal operating conditions, and stress factor analysis is also tabulated. The failure rate of the power electronic components that are prone to failure using the MIL handbook is calculated and compared in the table. The results show that the dual input interleaved boost converter provides high reliability, power source stress, power source redundancy, high efficiency, low component stress, and scalability.

SRM Institute of Science and Technology (IN)
Openalex Percentile: Top 93%
Radiation Effects in Electronics
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