A Novel Method for Testing Digital ICs

Digital Logic is the foundation of circuits and are used almost everywhere. The most commonly found and used digital logic are manufactured and used in the form of 16 pin DIP Package. The magnitude of its usage in both common and sophisticated electronics necessitates the verification of these ICs for their proper functioning. However traditional IC testers are often bulky as well as expensive and is not a popular option among hobbyists and small-scale industries. A novel and simple method has been employed to check these ICs in the form of Cloud Database Integration to check these ICs. The development of such an IC tester has been discussed in detail, highlighting all the aspects. This paper also explores all the benefits that are associated with this low-cost IC tester including accessibility and ease of use. Overall, this research paper aims to contribute in the field of IC testing by providing an efficient and feasible solution

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Publication Details

Published
2025-02-21
DOI
https://doi.org/10.1109/icidea64800.2025.10963240
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

A Novel Method for Testing Digital ICs

Sarita Samal, Minakhi Rout, Arjyadhara Pradhan, Anjishnu Saw et al.
Integrated Circuits and Semiconductor Failure Analysis
article

A Novel Method for Testing Digital ICs

Sarita Samal, Minakhi Rout, Arjyadhara Pradhan, Anjishnu Saw, Nabakishor Dash
article en

Abstract

Digital Logic is the foundation of circuits and are used almost everywhere. The most commonly found and used digital logic are manufactured and used in the form of 16 pin DIP Package. The magnitude of its usage in both common and sophisticated electronics necessitates the verification of these ICs for their proper functioning. However traditional IC testers are often bulky as well as expensive and is not a popular option among hobbyists and small-scale industries. A novel and simple method has been employed to check these ICs in the form of Cloud Database Integration to check these ICs. The development of such an IC tester has been discussed in detail, highlighting all the aspects. This paper also explores all the benefits that are associated with this low-cost IC tester including accessibility and ease of use. Overall, this research paper aims to contribute in the field of IC testing by providing an efficient and feasible solution

KIIT University (IN)
Openalex Percentile: Top 93%
Integrated Circuits and Semiconductor Failure Analysis
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A Novel Method for Testing Digital ICs — Sarita Samal, Minakhi Rout, et al. · (2025) | TGRS Research Map | TGRS