A 29.12-TOPS/W Vector Systolic Accelerator With NAS-Optimized DNNs in 28-nm CMOS
The increasing model size and computational load of deep neural networks (DNNs) present a significant challenge to deploy DNN models on constrained devices. To enhance performance without compromising accuracy, we introduce a neural architecture search (NAS) method to develop layer-wise mixed-precision and mixed-sparsity DNNs. However, the optimization cannot be directly applied to existing DNN accelerators due to the specific data requirements of layer-wise mixed precision and mixed sparsity. To address this issue, this research proposes separate mixed-precision and mixed-sparsity accelerators. Both accelerators demonstrate cutting-edge results. The mixed-precision accelerator utilizes a split-and-combination vector (SCV) to re-use variable precision units (1/2/4/8 bit) at each layer with a further vector systolic array (VSA) implementation. By optimizing NAS for mixed-precision VGG-16, the VSA achieves mixed energy efficiency reached 29.12 TOPS/W, which is equivalent to 2 bit and equivalent accuracy at 4 bit. The mixed-sparsity accelerator introduces a log-scale structured sparse encoding strategy, combined with MAC and group VSA (G-VSA) optimization, to enhance system performance. It achieves an average energy efficiency of up to 21.7 TOPS/W at 0.7 V and 400 MHz using 28-nm CMOS. The measured results show that the mixed-precision chip exhibits better energy efficiency and accuracy than the mixed-sparsity chip.
Authors
- Hao Yu (ORCID: https://orcid.org/0000-0002-2674-4118)
- A. M. Li
- Mingqiang Huang (ORCID: https://orcid.org/0000-0002-7794-3985)
- Quan Cheng (ORCID: https://orcid.org/0000-0001-5519-3258)
- Kai Li (ORCID: https://orcid.org/0000-0003-3251-931X)
- Shuxin Yang (ORCID: https://orcid.org/0000-0002-0794-7040)
Institutions
- Kyoto University (JP)
- Southern University of Science and Technology (CN)
- Shenzhen Institutes of Advanced Technology (CN)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2025-04-22
- DOI
- https://doi.org/10.1109/jssc.2025.3558287
- Citations
- 3
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 6.81