Fast and accurate matrix-OPC with MEEF prediction using Kolmogorov-Arnold network

Accurate correction of a mask segment can be done by taking its neighbor segments into account. In matrix-OPC, this is achieved by mathematically deriving mask bias using the mask error enhancement factor (MEEF) matrix. MEEF from segment i to segment j (µi,j ) denotes the EPE sensitivity of j while unit mask bias is applied to i. Extraction of MEEF matrix is labor intensive, and so matrix-OPC can only be limitedly used, usually in small critical regions of a layout. We employ a Kolmogorov-Arnold network (KAN) for fast prediction of MEEF values. Only geometric features, which are convenient to extract, are used as KAN inputs. The distance and relative angle between segments i and j are chosen; the direction and length of the two segments are also included; local densities around j are extracted as a map. KAN model is adopted due to its use of fewer weight parameters compared to traditional models like ANN, which results in a reduced need for training data. Predicted MEEF values are arranged as MEEF matrices and a linear system is solved for unknown mask biases. Experimental results show that the proposed matrix-OPC with quick prediction of MEEF through KAN is 11 times faster than standard matrix-OPC, with insignificant loss in OPC quality (0.13nm increase of average EPE).

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Publication Details

Published
2025-04-22
DOI
https://doi.org/10.1117/12.3051661
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
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article

Fast and accurate matrix-OPC with MEEF prediction using Kolmogorov-Arnold network

Sheung Hun Kim, Youngsoo Shin, Shilong Zhang
Industrial Vision Systems and Defect Detection
article

Fast and accurate matrix-OPC with MEEF prediction using Kolmogorov-Arnold network

Sheung Hun Kim, Youngsoo Shin, Shilong Zhang
article en

Abstract

Accurate correction of a mask segment can be done by taking its neighbor segments into account. In matrix-OPC, this is achieved by mathematically deriving mask bias using the mask error enhancement factor (MEEF) matrix. MEEF from segment i to segment j (µi,j ) denotes the EPE sensitivity of j while unit mask bias is applied to i. Extraction of MEEF matrix is labor intensive, and so matrix-OPC can only be limitedly used, usually in small critical regions of a layout. We employ a Kolmogorov-Arnold network (KAN) for fast prediction of MEEF values. Only geometric features, which are convenient to extract, are used as KAN inputs. The distance and relative angle between segments i and j are chosen; the direction and length of the two segments are also included; local densities around j are extracted as a map. KAN model is adopted due to its use of fewer weight parameters compared to traditional models like ANN, which results in a reduced need for training data. Predicted MEEF values are arranged as MEEF matrices and a linear system is solved for unknown mask biases. Experimental results show that the proposed matrix-OPC with quick prediction of MEEF through KAN is 11 times faster than standard matrix-OPC, with insignificant loss in OPC quality (0.13nm increase of average EPE).

Korea Advanced Institute of Science and Technology (KR)
Openalex Percentile: Top 89%
Industrial Vision Systems and Defect Detection
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