Edge Computing Accelerator for Real-Time Defect Detection of Photovoltaic Panel on Lightweight FPGAs
Photovoltaic (PV) panel defect detection algorithms are computationally and parametrically intensive, requiring powerful computing platforms. However, the powerful computing platforms are difficult to deploy in industrial field environments, which seriously reduces the applicability of PV panel defect detection algorithms. Therefore, this paper designs a real-time detection accelerator based on FPGA+ARM architecture (RDA). In the proposed RDA, the FPGA is utilized to implement specific accelerators for neural network operators, including components such as the operator processing unit, line buffer, two-stage pingpong buffer, and block factor. The ARM processor is responsible for orchestrating the accelerator to construct the neural network. The Winograd algorithm is employed in the construction of the convolutional operator processing unit. The line buffers have been designed with the objective of reducing the reuse of feature maps. The two-stage ping-pong buffer is designed to improve data access bandwidth, further enhancing system throughput. To maximize FPGA on-chip resource utilization, a resource and performance optimization model is constructed, under which block factor is developed. The RDA is deployed on a lightweight FPGA platform (ZYNQ7020) and evaluated using the YOLOv4- Tiny network as the baseline algorithm. The tasks of real-time detection of PV panel defect under two industrial sites (PV panel manufacturer and PV power plant) are realized. Furthermore, RDA accelerates VGG16 and YOLOv4-Tiny networks on the public datasets ultimately achieving 48.36GOP/s and 24.25GOP/s arithmetic with 3.75W and 4.582W power consumption on the same platform. The experimental results show that RDA has the advantages of low power consumption, high resource utilization, and low cost compared to previous FPGA accelerators.
Authors
- Liang Yang (ORCID: https://orcid.org/0000-0001-6291-4359)
- Changjun Wang (ORCID: https://orcid.org/0000-0002-5359-8363)
- Yuhan Liu (ORCID: https://orcid.org/0009-0002-2745-0194)
- Wei Zhang (ORCID: https://orcid.org/0000-0002-0109-5334)
- Haiyong Chen (ORCID: https://orcid.org/0000-0002-5262-4208)
- Jinlin Ye (ORCID: https://orcid.org/0009-0006-7353-7249)
- Yidong Zhou (ORCID: https://orcid.org/0000-0001-6741-007X)
Institutions
- Hebei University of Technology (CN)
- Chinese Academy of Medical Sciences & Peking Union Medical College (CN)
- Peking Union Medical College Hospital (CN)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3563001
- Citations
- 7
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 5.11
Funders
- National Natural Science Foundation of China