Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research

Transmission electron and soft x-ray microscopy have contributed significantly to our understanding of phenomena in fields ranging from biology to materials science by providing highly complementary information from the atomic level to the nano- and micrometre scale, including from structural, electronic, magnetic, and chemical perspectives. However, correlative transmission electron and soft x-ray microscopy investigations on the very same samples that take full advantage of their complementary imaging and spectroscopic capabilities are surprisingly rare. In this review, we focus on the most recent developments in combining the various types of transmission electron and soft x-ray microscopy techniques including progress in sample environment, in situ and operando techniques. Based on recent research examples ranging from nanocatalysis to functional materials and 2D materials, we highlight the unique opportunities promised by fully correlative transmission electron and soft x-ray microscopy approaches. • Correlative transmission electron and soft x-ray microscopy yield highly complementary information from atomic to mesoscale. • We discuss the fundamental, practical aspects, and recent developments in electron and soft x-ray correlative microscopy. • We highlight insights from correlated microscopy in fields from nanocatalysis to functional materials and 2D materials.

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Publication Details

Journal
Nano Today
Published
2025-04-21
DOI
https://doi.org/10.1016/j.nantod.2025.102732
Citations
2
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
5.10
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article

Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research

Armin Kleibert, C. A. F. Vaz, Rolf Erni
2 citations
Nano Today
Advanced Electron Microscopy Techniques and Applications
5.10
article

Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research

Armin Kleibert, C. A. F. Vaz, Rolf Erni
article en
2 citations

Abstract

Transmission electron and soft x-ray microscopy have contributed significantly to our understanding of phenomena in fields ranging from biology to materials science by providing highly complementary information from the atomic level to the nano- and micrometre scale, including from structural, electronic, magnetic, and chemical perspectives. However, correlative transmission electron and soft x-ray microscopy investigations on the very same samples that take full advantage of their complementary imaging and spectroscopic capabilities are surprisingly rare. In this review, we focus on the most recent developments in combining the various types of transmission electron and soft x-ray microscopy techniques including progress in sample environment, in situ and operando techniques. Based on recent research examples ranging from nanocatalysis to functional materials and 2D materials, we highlight the unique opportunities promised by fully correlative transmission electron and soft x-ray microscopy approaches. • Correlative transmission electron and soft x-ray microscopy yield highly complementary information from atomic to mesoscale. • We discuss the fundamental, practical aspects, and recent developments in electron and soft x-ray correlative microscopy. • We highlight insights from correlated microscopy in fields from nanocatalysis to functional materials and 2D materials.

Nano TodayVol. 63
Paul Scherrer Institute (CH), Swiss Light Source, Swiss Federal Laboratories for Materials Science and Technology (CH)
Openalex Percentile: Top 6%
Advanced Electron Microscopy Techniques and Applications
5.10
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Correlative transmission electron and soft x-ray microscopy for bridging length scales and functional properties in nanoscience and materials research — Armin Kleibert, C. A. F. Vaz, et al. · Nano Today (2025) | TGRS Research Map | TGRS