Heterogeneous and Monolithic 3D Integrated Full‐Color Micro‐Light‐Emitting Diodes via CMOS‐Compatible Oxide Bonding for µLEDoS

Abstract Micro‐light emitting diode (µLED) based LED on silicon (LEDoS) is a promising candidate for next‐generation AR and VR displays due to superior pixel performance and potential for high resolution. Traditional RGB pixels are placed on a single plane, which limits the resolution. To overcome this, vertically stacked RGB pixels using heterogeneous and monolithic 3D integration (M3D) have been explored. However, previously reported vertical µLED pixels have not considered the heat dissipation capability of the pixels, which is indeed important in future micro displays, and utilized materials incompatible with standard CMOS processes, further limiting their practicality for LEDoS. The critical regions for constraint, the bonding medium, are typically organic polymer materials. Therefore, to handle issue, vertically stacked full‐color µLEDs are demonstrated using silicon oxide (SiO 2 ) and yttrium oxide (Y 2 O 3 ), as bonding mediums. These materials are CMOS‐compatible and offer thermal conductivity at least 10 times higher than conventional polymers. The InGaN/GaN blue µLEDs bonded with oxides show improved thermal management, leading to higher external quantum efficiency (EQE) and better color characteristics, including narrower full width at half maximum (FWHM) and higher color purity. Precise control over bonding layer thickness is achieved, minimizing pixel thickness and enhancing manufacturability for high‐resolution displays.

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Publication Details

Journal
Laser & Photonics Review
Published
2025-04-19
DOI
https://doi.org/10.1002/lpor.202402116
Citations
4
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
5.03

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article

Heterogeneous and Monolithic 3D Integrated Full‐Color Micro‐Light‐Emitting Diodes via CMOS‐Compatible Oxide Bonding for µLEDoS

Juhyuk Park, Jouha Min, Joonsup Shim, Dae‐Myeong Geum et al.
4 citations
Laser & Photonics Review
GaN-based semiconductor devices and materials
5.03
article

Heterogeneous and Monolithic 3D Integrated Full‐Color Micro‐Light‐Emitting Diodes via CMOS‐Compatible Oxide Bonding for µLEDoS

Juhyuk Park, Jouha Min, Joonsup Shim, Dae‐Myeong Geum, Sanghyeon Kim, Seong Kwang Kim, Hyun soo Kim, Hyeongrak Lim, Inki Kim, Jaeyong Jeong, Jinha Lim, Woojin Baek
article en
4 citations

Abstract

Abstract Micro‐light emitting diode (µLED) based LED on silicon (LEDoS) is a promising candidate for next‐generation AR and VR displays due to superior pixel performance and potential for high resolution. Traditional RGB pixels are placed on a single plane, which limits the resolution. To overcome this, vertically stacked RGB pixels using heterogeneous and monolithic 3D integration (M3D) have been explored. However, previously reported vertical µLED pixels have not considered the heat dissipation capability of the pixels, which is indeed important in future micro displays, and utilized materials incompatible with standard CMOS processes, further limiting their practicality for LEDoS. The critical regions for constraint, the bonding medium, are typically organic polymer materials. Therefore, to handle issue, vertically stacked full‐color µLEDs are demonstrated using silicon oxide (SiO 2 ) and yttrium oxide (Y 2 O 3 ), as bonding mediums. These materials are CMOS‐compatible and offer thermal conductivity at least 10 times higher than conventional polymers. The InGaN/GaN blue µLEDs bonded with oxides show improved thermal management, leading to higher external quantum efficiency (EQE) and better color characteristics, including narrower full width at half maximum (FWHM) and higher color purity. Precise control over bonding layer thickness is achieved, minimizing pixel thickness and enhancing manufacturability for high‐resolution displays.

Laser & Photonics ReviewVol. 19(15)
Korea Advanced Institute of Science and Technology (KR), Inha University (KR), Korea Photonics Technology Institute (KR)
National Research Foundation, Ministry of Trade, Industry and Energy, National Research Foundation of Korea, Samsung
Openalex Percentile: Top 5%
GaN-based semiconductor devices and materials
5.03
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