Optical Properties of the Layered Phase of EuS2 near the Indirect Absorption Edge
Reflection microscopy in the visible and near-infrared range is used to study optical properties of EuS2 flakes. It is shown that for small flake areas, microreflection spectra can be adequately described by a model that combines the reflection of light from both the film‒substrate structure and the substrate. The indirect absorption edge (Eg = 0.83 eV) and the refractive index below the indirect absorption edge (n = 2.9) are determined from the microreflection spectra.
Authors
- Е. А. Екимов (ORCID: https://orcid.org/0000-0001-7644-0078)
- I. I. Usmanov (ORCID: https://orcid.org/0009-0007-1382-8391)
- С. Н. Николаев (ORCID: https://orcid.org/0000-0001-6739-7338)
- V. S. Krivobok (ORCID: https://orcid.org/0000-0001-8846-3891)
Institutions
- P.N. Lebedev Physical Institute of the Russian Academy of Sciences (RU)
- Institute for High Pressure Physics (RU)
Publication Details
- Journal
- Bulletin of the Lebedev Physics Institute
- Published
- 2025-03-01
- DOI
- https://doi.org/10.3103/s106833562460253x
- Primary Topic
- 2D Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00