Deep Learning-based Blind Image Quality Assessment using Extreme Learning Machine
In many image processing applications, Blind Image Quality Assessment (BIQA) plays a crucial role when the reference image is unavailable. However, existing BIQA methods often lack consistency with human perception and are limited to specific types of distortion. This research introduces a novel approach for image quality assessment by combining Convolutional Neural Network (CNN) feature extraction and Extreme Learning Machine (ELM) regression. By leveraging a pre-trained ResNet CNN model, features are extracted from distorted images and used to train the ELM model. The proposed method achieves accelerated convergence in deep model training and significantly enhances accuracy in predicting image quality compared to traditional regression methods. Experimental results demonstrate the superiority of the proposed approach over state-of-the-art BIQA methods, making it a promising solution for automated image quality evaluation in various applications such as image processing and computer vision.
Authors
- Siraya Sitthisarn
- Fazrul Faiz Zakaria (ORCID: https://orcid.org/0000-0002-3881-5112)
- Suwimol Jungjit
- Phaklen Ehkan (ORCID: https://orcid.org/0000-0001-9491-6850)
- Ruzelita Ngadiran (ORCID: https://orcid.org/0000-0001-7466-0368)
- Mohd Nazri Mohd Warip (ORCID: https://orcid.org/0000-0002-2154-0968)
- Nutveesa Verak
- Mohd Zaizu Ilyas
Institutions
- Universiti Malaysia Perlis (MY)
- Thaksin University (TH)
Publication Details
- Journal
- Pena Journal of Computer Science and Informatics
- Published
- 2025-03-17
- DOI
- https://doi.org/10.37934/pjcsi.1.1.112
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Universiti Malaysia Perlis