Demonstration of thermoelectrically cooled MWIR InAs/GaSb focal plane arrays

Thermoelectrically cooled focal plane arrays (FPAs) for the mid-wavelength infrared spectral range have been demonstrated. The mesa-shaped pixels were formed in pin InAs/GaSb heterostructure using dry etching. FPA with 320 × 256 resolution and a pixel pitch of 30 μm was obtained. Indium die-bonding was applied to connect FPA and a read-out integrated circuit. The thermoelectrically cooled hybrid was hermetically sealed in a vacuum housing with a silicon window. The pictures of the hot soldering tip were detected using FPA at different temperatures. • Focal plane array based on MWIR type II InAs/GaSb superlattice. • Photosensitive focal plane array mounted on thermoelectric cooler. • Focal plane array designed for HOT conditions. • Focal plane array utilising thermoelectric cooler push the SWaP-C criterion. • Images of hot soldering iron tip started to degrade at FPA temperature above 262 K.

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Publication Details

Journal
Materials Science in Semiconductor Processing
Published
2025-04-19
DOI
https://doi.org/10.1016/j.mssp.2025.109573
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Demonstration of thermoelectrically cooled MWIR InAs/GaSb focal plane arrays

A. Jasik, Joanna Branas, Krzysztof Hejduk, Krzysztof Bracha et al.
Materials Science in Semiconductor Processing
Advanced Semiconductor Detectors and Materials
article

Demonstration of thermoelectrically cooled MWIR InAs/GaSb focal plane arrays

A. Jasik, Joanna Branas, Krzysztof Hejduk, Krzysztof Bracha, Iwona Sankowska, Krzysztof Chmielewski, K. Regiński, E. Papis-Polakowska, M. Wzorek, Krzysztof Czuba, Pawel Kozłowski, Adam Korczyc, Marta Różycka, Adam Łaszcz, Maciej Fokt
article en

Abstract

Thermoelectrically cooled focal plane arrays (FPAs) for the mid-wavelength infrared spectral range have been demonstrated. The mesa-shaped pixels were formed in pin InAs/GaSb heterostructure using dry etching. FPA with 320 × 256 resolution and a pixel pitch of 30 μm was obtained. Indium die-bonding was applied to connect FPA and a read-out integrated circuit. The thermoelectrically cooled hybrid was hermetically sealed in a vacuum housing with a silicon window. The pictures of the hot soldering tip were detected using FPA at different temperatures. • Focal plane array based on MWIR type II InAs/GaSb superlattice. • Photosensitive focal plane array mounted on thermoelectric cooler. • Focal plane array designed for HOT conditions. • Focal plane array utilising thermoelectric cooler push the SWaP-C criterion. • Images of hot soldering iron tip started to degrade at FPA temperature above 262 K.

Materials Science in Semiconductor ProcessingVol. 194
Łukasiewicz Research Network (PL)
Narodowe Centrum Badań i Rozwoju
Affordable and clean energy
Openalex Percentile: Top 94%
Advanced Semiconductor Detectors and Materials
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