MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor

The CMOS image sensor (CIS) underpins optical applications, enabling high-resolution imaging across the visible and near-infrared spectra. Advances in nanofabrication have enhanced pixel density, improving resolution, but as pixel dimensions approach the diffraction limit, maintaining optical sensitivity without performance trade-offs remains challenging. Nanophotonic solutions, like nanophotonic-based color routers, address these limitations. This study builds on <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGB-Net</i>, a machine learning framework achieving 98% prediction accuracy in optimizing RGB sensitivity. We introduce <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGBX-Net</i>, which employs separate neural networks to optimize both RGB sensitivity and cross-talk, achieving 95% and 98% prediction accuracy, respectively. This enables precise optimization of critical parameters and serves as a foundation for Bayesian optimization to refine metasurface designs, ensuring efficient light routing through RGB channels while minimizing cross-talk. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGBX-Net</i> streamlines metasurface design and provides a scalable foundation for next-generation CIS applications in IoT, biomedical imaging, and environmental monitoring.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2025-04-18
DOI
https://doi.org/10.1109/led.2025.3562529
Citations
1
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
Field-Weighted Citation Impact
0.73

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article

MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor

YongKeun Lee, ByoungGyu Kim, JangHyeon Lee
1 citations
IEEE Electron Device Letters
CCD and CMOS Imaging Sensors
0.73
article

MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor

YongKeun Lee, ByoungGyu Kim, JangHyeon Lee
article en
1 citations

Abstract

The CMOS image sensor (CIS) underpins optical applications, enabling high-resolution imaging across the visible and near-infrared spectra. Advances in nanofabrication have enhanced pixel density, improving resolution, but as pixel dimensions approach the diffraction limit, maintaining optical sensitivity without performance trade-offs remains challenging. Nanophotonic solutions, like nanophotonic-based color routers, address these limitations. This study builds on <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGB-Net</i>, a machine learning framework achieving 98% prediction accuracy in optimizing RGB sensitivity. We introduce <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGBX-Net</i>, which employs separate neural networks to optimize both RGB sensitivity and cross-talk, achieving 95% and 98% prediction accuracy, respectively. This enables precise optimization of critical parameters and serves as a foundation for Bayesian optimization to refine metasurface designs, ensuring efficient light routing through RGB channels while minimizing cross-talk. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">MetaRGBX-Net</i> streamlines metasurface design and provides a scalable foundation for next-generation CIS applications in IoT, biomedical imaging, and environmental monitoring.

IEEE Electron Device LettersVol. 46(7)
Seoul National University of Science and Technology (KR), University of Minnesota (US)
Seoul National University of Science and Technology
Openalex Percentile: Top 29%
CCD and CMOS Imaging Sensors
0.73
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