Design of data acquisition node circuit test board

In the process of testing the data collection node circuit, it is often necessary to use universal equipment to assist. The testing process is complex, requires high personnel requirements, and has a high degree of subjectivity. Especially when testing the amplitude-frequency response of analog circuits, it is necessary to use general instruments such as signal sources and oscilloscopes to test many sets of data on the circuit, and the testing time for each circuit is several hours or more. The test board designed in this article can transmit the test parameters of the circuit board to the upper computer through an integrated signal generator module, voltage acquisition module, 485 communication, network port communication, and other modules. The upper computer can provide the test results by comparing them with the set parameter threshold of the qualified circuit. In practical engineering applications, it greatly improves the efficiency and accuracy of circuit board inspection. The use of automated detection methods can shorten the inspection work that could only be completed in hours with general instruments to a few minutes.