Investigation of Surface Flashover Mechanisms in SF <sub>6</sub> /N <sub>2</sub> Mixtures Under Nanosecond Pulse
SF<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sub>/N<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> mixtures combine excellent insulating properties with favorable environmental characteristics and are widely used in high-voltage equipment. Under nanosecond pulse conditions, the probability of flashover occurring at the gas-solid interface significantly increases. However, current research lacks an understanding of the underlying mechanisms of the key influencing factors. In this study, a flashover discharge model under nanosecond pulses at the gas-solid interface was developed to investigate the mechanisms by which field-induced emission and electron detachment influence surface flashover. Additionally, the effects of pulse front rise rate and gas pressure on the discharge process were analyzed. After considering field-induced emission in the model, the electron density at the ground electrode significantly increases, leading to a bifurcation phenomenon at the jet head. Furthermore, when electron detachment is taken into account, the jet flow bifurcation disappears, and the flashover time is reduced by 27.42%. Increasing the pulse front rise rate from 3 kV/ns to 5 kV/ns results in a 6.7% reduction in flashover time and an intensification of the discharge severity. High gas pressure suppresses the discharge process, with flashover time increasing by 17.1% when gas pressure rises from 0.2 MPa to 0.5 MPa. Moreover, high gas pressure promotes the discharge to preferentially propagate along the gas-solid interface, further exacerbating the discharge severity.
Authors
- Kaibin Liang (ORCID: https://orcid.org/0000-0003-0753-3507)
- Jun-Xian Du
- Yi Shuang (ORCID: https://orcid.org/0000-0001-8768-1432)
- She Chen (ORCID: https://orcid.org/0000-0001-7013-1442)
- Lipeng Zhong (ORCID: https://orcid.org/0000-0002-8435-7298)
- Zulong Liu
- Qiuqin Sun (ORCID: https://orcid.org/0000-0003-0732-5126)
- Feng Wang (ORCID: https://orcid.org/0000-0001-7734-0239)
- Nian Tang
- Dongwei Sun (ORCID: https://orcid.org/0000-0002-8316-5745)
Institutions
- Hunan University (CN)
- Shanghai Electric (China) (CN)
- China Southern Power Grid (China) (CN)
Publication Details
- Journal
- IEEE Transactions on Dielectrics and Electrical Insulation
- Published
- 2025-04-18
- DOI
- https://doi.org/10.1109/tdei.2025.3562163
- Citations
- 1
- Primary Topic
- High voltage insulation and dielectric phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.52
Funders
- National Natural Science Foundation of China