High-precision pulse width generation technology based on high-speed DAC

The pulse width parameter of integrated circuits is an important technical indicator for measuring the system's high-speed performance and rapid response capabilities, directly affecting the device's response speed and accuracy. Achieving traceability of integrated circuit time characteristic parameters is fundamental to ensuring the core performance of the system. The pulse width calibration device for integrated circuit testing systems calibrates the system by reproducing the behavior model of the parameters. Traditional waveform generation methods typically rely on cyclical reading of waveform memory, resulting in complex system designs, high storage resource usage, and lower waveform accuracy. To address these issues, a standard pulse width and rise/fall time waveform generation module based on an “FPGA + DAC” architecture has been designed. By directly utilizing the timing logic resources of the FPGA, multiple data modules are set up to generate waveform data in parallel, making waveform parameter adjustment more flexible and reducing waveform generation response time. Additionally, with the integration of an internal time parameter correction module, the accuracy and stability of the generated signal's time parameters are further improved, meeting the requirements for high-precision calibration.