Numerical analysis of a SiN digital Fourier transform spectrometer for a non-invasive glucose monitor

We performed numerical analysis on an integrated digital Fourier transform interferometer operating on a silicon-nitride platform. This device acquires Raman spectra through a switch-based digital Fourier transform spectrometer, employing a single optical power meter for detection. Using a standard regularized regression method, we successfully reconstructed a typical Raman skin spectrum in the range of 800<i>c</i><i>m</i>^-1 to 1800<i>c</i><i>m</i>^-1. Additionally, we varied the intensity of the Raman peak at 1125<i>c</i><i>m</i>^-1, corresponding to a characteristic glucose signature, and determined a minimal sensitivity threshold of <i>Δ</i><i>P</i>=0.509<i>n</i><i>W</i>.