Schottky barrier formation and band realignment of rare-earth tritelluride charge density wave material–semiconductor interfaces

We investigated the formation of Schottky barriers at the interface between rare-earth tritelluride (RTe3) crystals and n-type silicon (n-Si) substrates. This study explores the rectifying characteristics of RTe3/n-Si junctions (R = Dy, Ho, Er) and their relation to the charge density wave (CDW) transition. Using the thermionic emission model, we analyzed current–voltage (I–V) measurements to obtain the Schottky barrier height (ϕSBH) and the ideality factor (η). The temperature dependence of the extracted ϕSBH and η reveals kink features near the CDW transition temperature. The Schottky–Mott model is employed to explain these kink features in the derivatives of ϕSBH and 1/η and attributes them to changes in the work function of RTe3 during the CDW transition. Our findings suggest that Schottky junctions can be utilized to probe the electronic states of RTe3, enabling potential RTe3 device applications in electronics and optoelectronics.

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Publication Details

Journal
Applied Physics Letters
Published
2025-04-14
DOI
https://doi.org/10.1063/5.0253262
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Schottky barrier formation and band realignment of rare-earth tritelluride charge density wave material–semiconductor interfaces

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Schottky barrier formation and band realignment of rare-earth tritelluride charge density wave material–semiconductor interfaces

Rounak Banerjee, Blake Povilus, Sefaattin Tongay, Yunbo Ou, Jan Kopaczek, Seyed Tohid Rajaei Moosavy, Kentaro Yumigeta, Renee Sailus, Anvesh Yarra, Hayley Ruddick, Mukesh Kumar, Sushant Lakhavade, Zafer Mutlu
article en

Abstract

We investigated the formation of Schottky barriers at the interface between rare-earth tritelluride (RTe3) crystals and n-type silicon (n-Si) substrates. This study explores the rectifying characteristics of RTe3/n-Si junctions (R = Dy, Ho, Er) and their relation to the charge density wave (CDW) transition. Using the thermionic emission model, we analyzed current–voltage (I–V) measurements to obtain the Schottky barrier height (ϕSBH) and the ideality factor (η). The temperature dependence of the extracted ϕSBH and η reveals kink features near the CDW transition temperature. The Schottky–Mott model is employed to explain these kink features in the derivatives of ϕSBH and 1/η and attributes them to changes in the work function of RTe3 during the CDW transition. Our findings suggest that Schottky junctions can be utilized to probe the electronic states of RTe3, enabling potential RTe3 device applications in electronics and optoelectronics.

Applied Physics LettersVol. 126(15)
Wrocław University of Science and Technology (PL), University of Arizona (US), Arizona State University (US)
Division of Materials Research, Division of Civil, Mechanical and Manufacturing Innovation, Division of Electrical, Communications and Cyber Systems, Division of Chemistry, Division of Biological Infrastructure, Division of Materials Sciences and Engineering
Openalex Percentile: Top 95%
2D Materials and Applications
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