Learning from synthesized data for quality assurance in open-source microcontroller manufacturing

Authors

Abd Al Rahman M. Abu Ebayyeh (ORCID: https://orcid.org/0000-0001-5599-8005)
Zhifan Song (ORCID: https://orcid.org/0009-0009-8206-0608)

Publication Details

Journal: Measurement
Published: 2025-04-17
DOI: https://doi.org/10.1016/j.measurement.2025.117490
Citations: 5
Primary Topic: Industrial Vision Systems and Defect Detection
Type: article
Field-Weighted Citation Impact: 6.21

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article

Learning from synthesized data for quality assurance in open-source microcontroller manufacturing

Abd Al Rahman M. Abu Ebayyeh, Zhifan Song

Apr 17, 2025

5 citations

Measurement

Industrial Vision Systems and Defect Detection

6.21

article

Learning from synthesized data for quality assurance in open-source microcontroller manufacturing

Abd Al Rahman M. Abu Ebayyeh, Zhifan Song

April 17, 2025article en

5 citations

Abstract

No abstract available for this paper.

MeasurementVol. 253

Industry, innovation and infrastructure

Openalex Percentile: Top 4%

Industrial Vision Systems and Defect Detection

6.21

DOI Open Access PDF OpenAlex

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Learning from synthesized data for quality assurance in open-source microcontroller manufacturing — Abd Al Rahman M. Abu Ebayyeh, Zhifan Song · Measurement (2025) | TGRS Research Map | TGRS