Reliability Analysis of Multistate Sensor Array System Based on Sequential Binary Decision Diagram

The inclusion of overlay structures in sensor array systems is important for improving system reliability, yet it becomes more challenging when conducting reliability analysis. This paper addresses this challenge by separately modeling the reliability of detectable and unknown fault states in the sensor array system. Additionally, this paper introduces temporal logic into the analysis method for the sensor array system. Furthermore, the logical structure of the system is represented using a dynamic fault tree (DFT), and sequential binary decision diagrams (SBDDs) are utilized for system reliability analysis. To enhance system reliability, an incomplete coverage structure with redundant primary sensor units is added to the existing sensor array system. Finally, simulation results are presented to demonstrate the effectiveness of the proposed method.