Comparison of Surface Profile Measurement Methods

Abstract Accurately measuring the surface profile of blasted substrates is crucial for successful coatings applications. Commonly referenced standards, ASTM D4417 and ISO 8503-2, outline four primary methods for surface profile measurement: visual comparators, replica tape, depth micrometers, and drag stylus profilometers. However, limited guidance is available to help practitioners choose the most appropriate method for different applications. This study compares the speed, precision, and accuracy of these methods across a range of test panels with varying surface profiles. Measurements were conducted by 15 users with diverse experience levels, providing practical insights into the advantages and limitations of each technique.