Development of a compact microwave ion source for ion implantation
Abstract The ion source serves as the pivotal component influencing the performance of ion implantation systems. This paper presents a comprehensive global model based on a 2.45 GHz electron cyclotron resonance (ECR) ion source for optimizing B + ECR sources. The model establishes relationships among the B + plasma electron temperature, electron density, B + yield, operating pressure, and operating power, which align closely with the experimental results. Leveraging the model facilitates rapid optimization of the operational parameters for B + ions. The three-electrode extraction system of the ion source was optimized using IBsimu to enhance the extraction efficiency of B + ion beams. Ultimately, stable DC B + ion beams of 10 mA are extracted at microwave power 1000 W and 4 × 10 -4 Pa. The compact structure of the 2.45 GHz ECR B + ion source, with dimensions of only Ø180 × 200 mm for the entire ion acceleration and extraction system, demonstrates promising prospects for ion implantation systems.
Authors
- Wenbin Wu (ORCID: https://orcid.org/0000-0002-0101-5621)
- Rongxiang Zhang
- Mengting Li (ORCID: https://orcid.org/0000-0002-9923-8187)
- Weiping Chen (ORCID: https://orcid.org/0000-0001-5658-1914)
- Yang Ma (ORCID: https://orcid.org/0000-0001-5798-6155)
- Ailin Zhang (ORCID: https://orcid.org/0000-0001-9940-7430)
- Xin Xu
Institutions
- University of Science and Technology of China (CN)
Publication Details
- Journal
- Journal of Instrumentation
- Published
- 2025-04-01
- DOI
- https://doi.org/10.1088/1748-0221/20/04/p04016
- Citations
- 1
- Primary Topic
- Particle accelerators and beam dynamics
- Type
- article
- Field-Weighted Citation Impact
- 4.99