An Accurate Method for Refractive Index Measurement of PDMS Using a DOE Beam Splitter

Polydimethylsiloxane (PDMS) is widely used in optical devices due to its high transparency, biocompatibility, chemical inertness and easy fabrication. Accurate measurement of the PDMS refractive index (RI) is critical for optical applications. In this study, a simple, accurate and reliable method is proposed for measuring the RI of PDMS, which leverages diffractive optical element (DOE) to determine the RI of PDMS by analyzing the uniformity of DOE filled with PDMS. The uniformity of the DOE beam splitter directly depends on the RI difference between the DOE material and filling material. The 3×3, 3×5, 3×7, and 5×5 DOE beam splitters are designed using the Iterative Fourier Transform Algorithm (IFTA) and fabricated through one-step fabrication for RI measurement of PDMS. The RI of PDMS measured using the proposed method shows a mean nPDMS of 1.3826 at 1550 nm with a standard deviation of 0.001, which represents a 12-fold improvement compared to the standard deviation of 0.012 from a mean nPDMS of 1.3934 measured using spectroscopic ellipsometry (SE). This method demonstrates high accuracy and reliability, which can measure the RI of any unknown transparent material compatible with spin-coated or poured on a fabricated DOE beam splitter.

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Publication Details

Journal
IEEE Photonics Technology Letters
Published
2025-04-16
DOI
https://doi.org/10.1109/lpt.2025.3561715
Primary Topic
Advanced Fiber Optic Sensors
Type
article
Field-Weighted Citation Impact
0.00

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article

An Accurate Method for Refractive Index Measurement of PDMS Using a DOE Beam Splitter

Ao Yu, Xingang Dai, Yanjun Hu, Guofang Fan et al.
IEEE Photonics Technology Letters
Advanced Fiber Optic Sensors
article

An Accurate Method for Refractive Index Measurement of PDMS Using a DOE Beam Splitter

Ao Yu, Xingang Dai, Yanjun Hu, Guofang Fan, Bowen Niu, Dai Qun
article en

Abstract

Polydimethylsiloxane (PDMS) is widely used in optical devices due to its high transparency, biocompatibility, chemical inertness and easy fabrication. Accurate measurement of the PDMS refractive index (RI) is critical for optical applications. In this study, a simple, accurate and reliable method is proposed for measuring the RI of PDMS, which leverages diffractive optical element (DOE) to determine the RI of PDMS by analyzing the uniformity of DOE filled with PDMS. The uniformity of the DOE beam splitter directly depends on the RI difference between the DOE material and filling material. The 3×3, 3×5, 3×7, and 5×5 DOE beam splitters are designed using the Iterative Fourier Transform Algorithm (IFTA) and fabricated through one-step fabrication for RI measurement of PDMS. The RI of PDMS measured using the proposed method shows a mean nPDMS of 1.3826 at 1550 nm with a standard deviation of 0.001, which represents a 12-fold improvement compared to the standard deviation of 0.012 from a mean nPDMS of 1.3934 measured using spectroscopic ellipsometry (SE). This method demonstrates high accuracy and reliability, which can measure the RI of any unknown transparent material compatible with spin-coated or poured on a fabricated DOE beam splitter.

IEEE Photonics Technology LettersVol. 37(13)
Beijing Jiaotong University (CN)
National Key Research and Development Program of China
Openalex Percentile: Top 94%
Advanced Fiber Optic Sensors
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An Accurate Method for Refractive Index Measurement of PDMS Using a DOE Beam Splitter — Ao Yu, Xingang Dai, et al. · IEEE Photonics Technology Letters (2025) | TGRS Research Map | TGRS